The Surface Roughness Tester offered by us measures surface texture
of metal and non-metal parts. The small and compact size makes it easily
transportable. The artificial intelligence functions automatically select
the ideal cut off value, measuring range and other conditions. It is user
friendly and supports wide range of styli options.
SURFCOM 130A make: ZEISS
Salient features:
- Top Flight Performance in Production
- Best of class Straightness Accuracy 0.3um/50 mm
- Easy Change of Stylish
- Wide Range of styli options
- 50 mm traverse length, built in datum plane and large measuring range
detector
- Selectable Amplifier LCD touch panel
- Handy, compact use
- Analysis parameters catering to worldwide requirements
- Artificial Intelligence functions automatically select the ideal cut
off value, measuring range and other conditions. This automates
measurement.
- Host of Analysis Functions- incorporates 34 types of roughness and
32 waviness parameters.
- Tilt Correction Function: Six type of automatic tilt correction are
provided.
- Evaluation Range Setting- The waveform on the screen is enclosed by
two cursors, allowing the desired range to be set and the parameters to
be calculated.
- PC Card Slot- Measuring Conditions, Measured result management or
measured data can be output in binary and text format.
SPECIFICATIONS:
Measuring Range: X Axis- 50mm
Z axis - 800µ mm (Measuring range resolution: 800µm/10nm,
80µm/1nm, 8 µm/0.1nm)
Straightness accuracy: 0.3µm/50mm
Analysis items:
Standards: Complies with JIS-2001, JIS-1994, JIS-19822, ISO- 1997,
ISO-1984, DIN-1990, ASME-1995, and CNOMO.
Parameters: Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z,
Sm, S, R ?a, R ?q, R ?a, R ?q, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1,
Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R dc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx,
AR, NR, CPM, SR, SAR
Evaluation curves: Section profile curve, filtered waviness curve,
filtered center line waviness curve, rolling circle waviness curve, rolling
circle center line waviness curve, DIN4776 special curve, roughness motif
curve, envelope waviness curve
Surface Characteristics graphs: Bearing area, curve, amplitude
distribution (ADF) curve, power graph
TILT Correction: Linear correction, first half correction, latter
half correction, both end correction, spline curve correction
Magnification : Vertical (Z-axis)- 50-100K Auto, Horizontal
(X-axis): 1-5K auto
Detector : Tip radius 2µm, material diamond
Special functions: Artificial Intelligence functions, step
analysis, PC card
Standard Accessories: Standard specimen, Recording Paper, Touch Pen,
Instruction Manual